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The RF & Wireless Virtual Series is a three-part webinar experience designed to help you address the complex challenges RF engineers face. Learn how a modular, software-defined platform can help you reduce test time, increase productivity, and lower cost. The series is intended for test engineers, technicians, and managers who face the challenge of keeping the cost of RF and wireless test low enough to maintain appropriate unit pricing.
To create the connected systems of tomorrow, a platform-based approach will be necessary to overcome the next generation of RF and wireless challenges. These include expanding to test billions of devices linked by the Internet of Things and prototyping the novel waveforms and air interfaces of 5G communications. This webcast will discuss the role modular and reconfigurable systems play in scaling for the changing needs, technologies and applications of wireless systems.
With the explosion of wireless technology, engineers are increasingly required to transition RFIC's from R&D to production test more quickly - and at a lower cost. In this session we will review some of the key technologies required for testing RFICs in R&D - such as envelope tracking (ET) and digital predistortion (DPD). In addition, we will introduce new features of the NI Semiconductor Test System that are used for production test cell integration.
A transient signal is either a one-time event, or a periodic event in which the event duration is very short as compared to the period of the waveform. In RF and microwave systems, such events might be intentionally generated as pulses (radar signals), as noise, or as maliciously interfering transients. This webcast discusses how wideband real-time signal capture and analysis techniques can offer key insight which allows engineers to perform root-cause analysis and define mitigation strategy.